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Reliability study of InGaN/GaN light-emitting diode

published_or_final_version / Electrical and Electronic Engineering / Master / Master of Philosophy

  1. 10.5353/th_b4322415
  2. b4322415
Date January 2009
CreatorsLi, Zonglin, 李宗林
ContributorsChoi, HW, Lai, PT
PublisherThe University of Hong Kong (Pokfulam, Hong Kong)
Source SetsHong Kong University Theses
Detected LanguageEnglish
RightsThe author retains all proprietary rights, (such as patent rights) and the right to use in future works., Creative Commons: Attribution 3.0 Hong Kong License
RelationHKU Theses Online (HKUTO)

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