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Characteristic X-ray, Photoelectron And Compton-scattered Photon Escape From A Hpge Detector

Escape of photoelectrons, Compton-scattered photons and Ge X-rays from a HPGe detector was studied as a function of energy in the range 8-52 keV. A variable-energy source producing Cu, Rb, Mo, Ag, Ba, and Tb X-rays was used. All three mechanisms for energy loss were observed in the same experiment for Ba and Tb, while only X-ray and photoelectron escapes were evident in the spectra for Ag, Mo, Rb, and Cu. Spectral features and possible mechanisms for partial energy deposition were investigated. A Monte Carlo program was used to simulate the relevant interactions and to estimate the escape probabilities.

Identiferoai:union.ndltd.org:METU/oai:etd.lib.metu.edu.tr:http://etd.lib.metu.edu.tr/upload/3/1210061/index.pdf
Date01 April 2003
CreatorsYilmaz, Ercan
ContributorsCan, Cuneyt
PublisherMETU
Source SetsMiddle East Technical Univ.
LanguageEnglish
Detected LanguageEnglish
TypePh.D. Thesis
Formattext/pdf
RightsTo liberate the content for public access

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