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Study on Architecture-Oriented Memory Assembly and Testing OEM Factory Manufacturing Resource Planning Management Model

Memory assembly and testing OEM as the IC semiconductor backend process by Taiwan conducts 30% manufacturing output globally. Mainly 50% of the output focused on DRAM. The quality and shipping were headed as the key factor all over the world. The manufacturing process improved in South Korea and mainland China accompanied with the raw material price rising after the 311 earthquake in Japan, enterprises encountering enormous challenge so their OEM manufacturing needs to incorporate the copper wiring process and lower the cost to enhance the competitiveness.
The rush orders exhausted the DRAM on-hand parts after economic recovery during the first half of 2011. The shortage mainly came from raw materials, human resources and equipments. Precise planning with elastic resource and information system control became the top priority. Therefore as Elpida, the DRAM manufacturer in Japan, filed the bankruptcy protection, memory assembly and testing OEM manufacturers should be paced in tuning the policy of enterprise, organization, production elements and information system to face the rapid global economic environments change.
We propose architecture-oriented memory assembly and testing OEM factory manufacturing resource planning management model (AOMATOEMFMRPMM) in this study. AOMATOEMFMRPMM is an enterprise architecture which uses structure-behavior coalescence to define the components, operations and task forces during the planning of the manufacturing resources. AOMATOEMFMRPMM lets corporation supervisors understand and manipulate effectively the manufacturing resources, lessen the risk of re-organization, improve the quality of maintenance and efficiency of communication of the information system.

Identiferoai:union.ndltd.org:NSYSU/oai:NSYSU:etd-0612112-014830
Date12 June 2012
CreatorsHsu, I-Cheng
ContributorsYi-Jen Chuang, Jo-Yu Li, William S. Chao, Te-Min Chang
PublisherNSYSU
Source SetsNSYSU Electronic Thesis and Dissertation Archive
LanguageCholon
Detected LanguageEnglish
Typetext
Formatapplication/pdf
Sourcehttp://etd.lib.nsysu.edu.tw/ETD-db/ETD-search/view_etd?URN=etd-0612112-014830
Rightsunrestricted, Copyright information available at source archive

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