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The Effect of Chloride Ion and Copper Oxide Layer on Plastic-encapsulated Package Reliability

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Identiferoai:union.ndltd.org:NSYSU/oai:NSYSU:etd-0620101-190653
Date20 June 2001
CreatorsHuang, Sheng-Tzung
ContributorsK. Y. Hsieh, Bae-Heng Tseng, Tsu-Hsin Chang, Ker-Chang Hsieh
PublisherNSYSU
Source SetsNSYSU Electronic Thesis and Dissertation Archive
LanguageCholon
Detected LanguageEnglish
Typetext
Formatapplication/pdf
Sourcehttp://etd.lib.nsysu.edu.tw/ETD-db/ETD-search/view_etd?URN=etd-0620101-190653
Rightsnot_available, Copyright information available at source archive

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