This paper is to present the measurement of high-speed traveling-wave electroabsorption modulator (TW-EAM). A traveling-wave electrode structure can overcome RC limitation and allows longer device for the high-speed performance. Low driving voltage, high extinction ratio and high optical saturation power can thus be obtained. Two structures of TW-EAMs are taken as examples, namely ridge- (ri-) and undercut-etching-active (un-) types. The topic of this work includes all the electrical, optical and electrical-to-optical measurement for the characterization of TW-EAM.
The characterization on EAM is divided by three steps : electrical-to-electrical, optical-to-optical and electrical-to-optical measurement. Firstly, by using a 40GHz vector network analyzer, the microwave-propagation loss and reflection loss are extracted from scattering-parameters (S-parameters). Secondly, the optical propagation loss in waveguide is obtained by comparing the optical transmission of different lengths of EAMs. Finally, the electrical-to-optical response is obtained by transferring the high-speed-modulated optical signal to electrical signal by a high-speed photodetector. It has been shown that the un-TW-EAM can have advantages over the ri- types due to the lower microwave and optical propagation loss.
| Identifer | oai:union.ndltd.org:NSYSU/oai:NSYSU:etd-0712104-123511 |
| Date | 12 July 2004 |
| Creators | Yen, Bon-Jen |
| Contributors | Tao-Yuan Chang, Keh-Yi Lee, Yi-Jen Chiu, Sheng-Lung Huang |
| Publisher | NSYSU |
| Source Sets | NSYSU Electronic Thesis and Dissertation Archive |
| Language | Cholon |
| Detected Language | English |
| Type | text |
| Format | application/pdf |
| Source | http://etd.lib.nsysu.edu.tw/ETD-db/ETD-search/view_etd?URN=etd-0712104-123511 |
| Rights | not_available, Copyright information available at source archive |
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