In recent years with the changes of time, academic dishonest behaviors become more and more general. With the highly development of technology and the help of Internet, student can easily get all kinds of materials and commit plagiarism now. Cause there are still none related researches about the plagiarism behaviors in graduation theses, this study would try to figure out the plagiarism behaviors of the graduate students in writing theses about the technology acceptance model in Taiwan.
In this study , we would like to find out the writing in 6 different dimensions. The description of the theory of the technology of acceptance model, the description of the the perceived usefulness, the description of the perceived ease of use, the description of external variables, the use of figure of theoretical framework and the use of the table of researches concerned.
This study had chosen 226 graduation theses for sampled. Through using the content analysis, the major findings are as followed:
(1) Plagiarism did happen in graduation theses in Taiwan
(2) Most of what happened in all types of plagiarism behaviors is forming a new sentence without citing the source.
(3) Students are lack of how to do a suitable writing , often forget to cite the sources and do not know it¡¦s necessary to write complete descriptions of whole variables.
(4) Some students prefer to change what¡¦s in the figure of theoretical framework arbitrarily, and do not know it¡¦s necessary for citing the source of the figure.
| Identifer | oai:union.ndltd.org:NSYSU/oai:NSYSU:etd-0911108-165249 |
| Date | 11 September 2008 |
| Creators | Lee, Cho-ken |
| Contributors | Chun-Chin Yang, Sue-Jen Lin, Hsiang Chen |
| Publisher | NSYSU |
| Source Sets | NSYSU Electronic Thesis and Dissertation Archive |
| Language | Cholon |
| Detected Language | English |
| Type | text |
| Format | application/pdf |
| Source | http://etd.lib.nsysu.edu.tw/ETD-db/ETD-search/view_etd?URN=etd-0911108-165249 |
| Rights | not_available, Copyright information available at source archive |
Page generated in 0.0023 seconds