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Characterization of substrate noise coupling, its impacts and remedies in RF and mixed-signal ICs

Thesis (Ph. D.)--Ohio State University, 2006. / Full text release at OhioLINK's ETD Center delayed at author's request

Identiferoai:union.ndltd.org:OCLC/oai:xtcat.oclc.org:OCLCNo/123007363
Date January 2006
CreatorsHelmy, Ahmed.
PublisherColumbus, Ohio : Ohio State University,
Source SetsOCLC
LanguageEnglish
Detected LanguageEnglish
SourceConnect to resource online

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