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Test fixture characterization for high-frequency silicon substrate parasitic extraction /

Thesis (M.S.)--Oregon State University, 2008. / Printout. Includes bibliographical references (leaves 72-73). Also available on the World Wide Web.

Identiferoai:union.ndltd.org:OCLC/oai:xtcat.oclc.org:OCLCNo/174041523
Date January 1900
CreatorsTabalujan, Andrew R.
Source SetsOCLC
LanguageEnglish
Detected LanguageEnglish

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