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Development of a statistical model for NPN bipolar transistor mismatch

Thesis (M.S.) -- Worcester Polytechnic Institute. / Keywords: statistical model; mismatch; bipolar transistor. Includes bibliographical references (p.29).

Identiferoai:union.ndltd.org:OCLC/oai:xtcat.oclc.org:OCLCNo/181739135
Date January 2007
CreatorsLamontagne, Maurice.
Source SetsOCLC
LanguageEnglish
Detected LanguageEnglish
SourceLink to electronic thesis

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