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High-resolution analytical electron microscopy and creep deformation of silicon nitride ceramics /

Thesis (Ph.D.) -- McMaster University, 1998. / Includes bibliographical references (leaves 186-196). Also available via World Wide Web.

Identiferoai:union.ndltd.org:OCLC/oai:xtcat.oclc.org:OCLCNo/181806265
Date January 1998
CreatorsJin, Qiang.
Source SetsOCLC
LanguageEnglish
Detected LanguageEnglish
Source*McMaster only

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