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Low cost test fixture for self-resonant frequency measurements of passive chip components

Thesis (Ph.D.)--University of Nevada, Reno, 2005. / "August, 2005." Includes bibliographical references (leaves 74-75). Online version available on the World Wide Web.

Identiferoai:union.ndltd.org:OCLC/oai:xtcat.oclc.org:OCLCNo/184908347
Date January 2005
CreatorsAkambi, Aboudou S.
Source SetsOCLC
LanguageEnglish
Detected LanguageEnglish
Sourceabstract and full text PDF (free order & download UNR users only)

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