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Surface characterisation using ToF-SIMS, AES and XPS of silane films and organic coatings deposited on metal substrates /

Diss. (sammanfattning) Uppsala : Univ., 2003. / Härtill 9 uppsatser.

Identiferoai:union.ndltd.org:OCLC/oai:xtcat.oclc.org:OCLCNo/186588845
Date January 2003
CreatorsBexell, Ulf,
PublisherUppsala : Acta Universitatis Upsaliensis : Univ.-bibl. [distributr],
Source SetsOCLC
LanguageEnglish
Detected LanguageEnglish

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