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Built-in self test of configurable memory resources in field programmable gate arrays

Thesis (M.S.)--Auburn University, 2007. / Abstract. Vita. Includes bibliographic references (ℓ. 101-103)

Identiferoai:union.ndltd.org:OCLC/oai:xtcat.oclc.org:OCLCNo/213336764
Date January 2007
CreatorsMilton, Daniel,
PublisherAuburn, Ala. ,
Source SetsOCLC
LanguageEnglish
Detected LanguageEnglish

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