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Reliability testing and modeling of linear image sensor devices

Thesis (M.S.)--State University of New York at Binghamton, Industrial and Systems Engineering Department, 2006. / Includes bibliographical references.

Identiferoai:union.ndltd.org:OCLC/oai:xtcat.oclc.org:OCLCNo/213433973
Date January 2006
CreatorsGosavi, Mridula.
Source SetsOCLC
LanguageEnglish
Detected LanguageEnglish
TypeWeb sites. Electronic dissertations.
SourceOnline access via UMI:

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