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Automated model parameter extraction for noise coupling analysis in silicon substrates /

Thesis (M.S.)--Oregon State University, 2008. / Printout. Includes bibliographical references (leaves 60-62). Also available on the World Wide Web.

Identiferoai:union.ndltd.org:OCLC/oai:xtcat.oclc.org:OCLCNo/214061506
Date January 1900
CreatorsPeterson, Brett.
Source SetsOCLC
LanguageEnglish
Detected LanguageEnglish

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