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Characterization of high temperature creep in siliconized silicon carbide using ultrasonic techniques /

Thesis (M.S.)--Virginia Polytechnic Institute and State University, 1990. / Vita. Abstract. Includes bibliographical references (leaves 75-76). Also available via the Internet.
Date January 1990
CreatorsButtram, Jonathan D.,
Source SetsOCLC
Detected LanguageEnglish
SourceThis resource online

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