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Built-in self-test configurations for field programmable gate array cores in systems-on-chip

Thesis(M.S.)--Auburn University, 2004. / Abstract. Vita. Includes bibliographic references (p.123-125).

Identiferoai:union.ndltd.org:OCLC/oai:xtcat.oclc.org:OCLCNo/243623356
Date January 2004
CreatorsHarris, Jonathan McKinley, Stroud, Charles E.
PublisherAuburn, Ala. ,
Source SetsOCLC
LanguageEnglish
Detected LanguageEnglish

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