Characterization of electromigration in semiconductor device interconnects using microscopic techniques /

Description

Thesis (Ph.D.) -- University of Rhode Island, 2007 / Typescript. Includes bibliographical references (leaves 103-105).

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1. http://0-digitalcommons.uri.edu.helin.uri.edu/dissertations/AAI3298367

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Additional Fields

Identifer	oai:union.ndltd.org:OCLC/oai:xtcat.oclc.org:OCLCNo/246203581
Date	January 2007
Creators	Dingari, Narahara C.
Source Sets	OCLC
Language	English
Detected Language	English
Source	View online ; access limited to URI.