Comparison of the mid-frequency line edge noise algorithms of Jim Hamerly and Yigal Gur for best correlation to the psychophysical defect known as raggedness /

Description

Thesis (M.S.)--Rochester Institute of Technology, 1987. / Typescript. Includes bibliographical references (leaf 15).

Links & Downloads

1. http://hdl.handle.net/1850/10135

Tags

Additional Fields

Identifer	oai:union.ndltd.org:OCLC/oai:xtcat.oclc.org:OCLCNo/25903889
Date	January 1987
Creators	Huff, Kevin G.
Source Sets	OCLC
Language	English
Detected Language	English
Source	Online version of thesis