AFM-based measurement of the mechanical properties of thin polymer films and determination of the optical path length of nearly index-matched cavities

Description

Thesis (Ph. D.)--University of Texas at Austin, 2008. / Vita. Includes bibliographical references.

Links & Downloads

1. http://www.lib.utexas.edu/etd/d/2008/wielandc09712/wielandc09712.pdf#page=3

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Additional Fields

Identifer	oai:union.ndltd.org:OCLC/oai:xtcat.oclc.org:OCLCNo/273019060
Date	January 1900
Creators	Wieland, Christopher F.,
Publisher	[Austin, Tex. : University of Texas Libraries,
Source Sets	OCLC
Language	English
Detected Language	English