Return to search

Non-destructive x-ray characterization of wide-bandgap semiconductor materials and device structures

Thesis (Ph.D.)--George Mason University, 2008. / Vita: p. 104. Thesis director: Mulpuri V. Rao. Submitted in partial fulfillment of the requirements for the degree of Doctor of Philosophy in Electrical and Computer Engineering. Title from PDF t.p. (viewed Mar. 17, 2009). Includes bibliographical references (p. 99-103). Also issued in print.

Identiferoai:union.ndltd.org:OCLC/oai:xtcat.oclc.org:OCLCNo/316604931
Date January 2008
CreatorsMahadik, Nadeemullah A.
PublisherFairfax, VA : George Mason University,
Source SetsOCLC
LanguageEnglish
Detected LanguageEnglish

Page generated in 0.1467 seconds