Monitoring and diagnosis of process faults and sensor faults in manufacturing processes

Description

Thesis supervisor: Yong Chen. Includes bibliographical references (p. 79-84).

Links & Downloads

1. http://ir.uiowa.edu/etd/206

Tags

Additional Fields

Identifer	oai:union.ndltd.org:OCLC/oai:xtcat.oclc.org:OCLCNo/438853900
Date	January 2008
Creators	Li, Shan. Chen, Yong.
Source Sets	OCLC
Language	English
Detected Language	English