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Optical low coherence reflectometery for morphological characterization of static and dynamic systems /

Thesis (Ph. D.)--University of Washington, 2000. / Vita. Includes bibliographical references (leaves 200-205).

Identiferoai:union.ndltd.org:OCLC/oai:xtcat.oclc.org:OCLCNo/44903002
Date January 2000
CreatorsThurber, Simonida Rutar.
Source SetsOCLC
LanguageEnglish
Detected LanguageEnglish
TypeTheses
SourceConnect to this title online; UW restricted

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