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Wavelet-based estimation for trend contaminated long memory processes /

Thesis (Ph. D.)--University of Washington, 2000. / Vita. Includes bibliographical references (leaves 164-170).

Identiferoai:union.ndltd.org:OCLC/oai:xtcat.oclc.org:OCLCNo/47030809
Date January 2000
CreatorsCraigmile, Peter Francis,
Source SetsOCLC
LanguageEnglish
Detected LanguageEnglish
TypeTheses
SourceConnect to this title online; UW restricted

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