Return to search

Mechanical properties of Tial-based thin films /

Thesis (M. Phil.)--University of Hong Kong, 2001. / Includes bibliographical references.

Identiferoai:union.ndltd.org:OCLC/oai:xtcat.oclc.org:OCLCNo/48929316
Date January 2001
CreatorsLi, Sui-yu.
PublisherHong Kong : University of Hong Kong,
Source SetsOCLC
LanguageEnglish
Detected LanguageEnglish
SourceClick to view the Table of Contents. Click to view the Abstract.

Page generated in 0.0055 seconds