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Coping with delays and hazards in buses and random logic in deep sub-micron /

Thesis (Ph. D.)--Southern Illinois University Carbondale, 2009. / "Department of Electrical and Computer Engineering." Keywords: Crosstalk, Deep sub-micron, Delays, Hazards, Radiation, Data buses. Includes bibliographical references (p. 122-135). Also available online.

Identiferoai:union.ndltd.org:OCLC/oai:xtcat.oclc.org:OCLCNo/493457555
Date January 2009
CreatorsSkoufis, Michael N.,
Source SetsOCLC
LanguageEnglish
Detected LanguageEnglish
SourceAvailable to subscribers only.

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