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Nonometer scale electrical characterization of thin dielectric films

Thesis (Ph. D.)--Ohio State University, 2002. / Title from first page of PDF file. Document formatted into pages; contains xix, 148 p.; also contains graphics (some col.). Includes abstract and vita. Advisor: Jonathan Pelz, Dept. of Physics. Includes bibliographical references (p. 144-148).

Identiferoai:union.ndltd.org:OCLC/oai:xtcat.oclc.org:OCLCNo/50478950
Date January 2002
CreatorsLee, David T.
Source SetsOCLC
LanguageEnglish
Detected LanguageEnglish
SourceConnect to this title online

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