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An audit model for intellectual property management excellence /

Thesis (Eng.D.)--City University of Hong Kong, 2009. / "Submitted to Department of Manufacturing Engineering and Engineering Management in partial fulfillment of the requirements for the degree of Engineering Doctorate." Includes bibliographical references (leaves 319-354)

Identiferoai:union.ndltd.org:OCLC/oai:xtcat.oclc.org:OCLCNo/555545377
Date January 2009
CreatorsLiu, Tak Wing.
Source SetsOCLC
LanguageEnglish
Detected LanguageEnglish
Sourceaccess full-text access abstract and table of contents

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