Return to search

A simulation study of the error induced in one-shine reliability confidence bounds for the Weiball distribution using a small sample size with heavily censored data /

Thesis (M.S. in Applied Science)--Naval Postgraduate School, Dec. 2004. / Thesis Advisor(s): David H. Olwell. Includes bibliographical references (p. 57). Also available online.

Identiferoai:union.ndltd.org:OCLC/oai:xtcat.oclc.org:OCLCNo/58524954
Date January 2004
CreatorsHartley, Michael A.
PublisherMonterey, Calif. : Springfield, Va. : Naval Postgraduate School ; Available from National Technical Information Service,
Source SetsOCLC
LanguageEnglish
Detected LanguageEnglish
Source(1.06 MB)

Page generated in 0.0019 seconds