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P-n junction dopant profiling using scanning capacitance microscopy /

Thesis (Ph.D.) - University of Queensland, 2005. / Includes bibliography.

Identiferoai:union.ndltd.org:OCLC/oai:xtcat.oclc.org:OCLCNo/62544712
Date January 2004
CreatorsYang, Jing.
Publisher[St. Lucia, Qld.],
Source SetsOCLC
LanguageEnglish
Detected LanguageEnglish
SourceP-n junction dopant profiling using scanning capacitance microscopy</a><br>Read the abstract of the thesis

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