Development and evaluation of a test system for the quality assurance during the mass production of silicon microstrip detector modules for the CMS experiment

Description

Aachen, Techn. Hochsch., Diss., 2005. / Computerdatei im Fernzugriff.

Links & Downloads

1. http://sylvester.bth.rwth-aachen.de/dissertationen/2005/178/05_178.pdf
2. http://sylvester.bth.rwth-aachen.de/dissertationen/2005/178/index.htm
3. http://deposit.ddb.de/cgi-bin/dokserv?idn=976561840

Tags

LHC

Additional Fields

Identifer	oai:union.ndltd.org:OCLC/oai:xtcat.oclc.org:OCLCNo/637467081
Date	January 2005
Creators	Franke, Torsten.
Publisher	[S.l.] : [s.n.],
Source Sets	OCLC
Language	Undetermined
Detected Language	English