Measurement of surface forces of adsorbed layers on smooth substrates

Description

Siegen, Univ., Diss., 2002. / Computerdatei im Fernzugriff.

Links & Downloads

1. http://www.ub.uni-siegen.de/pub/diss/fb8/2002/franz/franz.pdf
2. http://deposit.ddb.de/cgi-bin/dokserv?idn=964168316

Tags

Rasterkraftmikroskopie

Additional Fields

Identifer	oai:union.ndltd.org:OCLC/oai:xtcat.oclc.org:OCLCNo/638362163
Date	January 2001
Creators	Franz, Volker.
Publisher	[S.l.] : [s.n.],
Source Sets	OCLC
Language	Undetermined
Detected Language	English