Dynamic parameter identification techniques and test structures for microsystems characterization on wafer level

Description

Zugl.: Chemnitz, Techn. Univ., Diss., 2009

Links & Downloads

1. http://d-nb.info/1000815250/04

Tags

Additional Fields

Identifer	oai:union.ndltd.org:OCLC/oai:xtcat.oclc.org:OCLCNo/642319676
Date	January 2009
Creators	Shaporin, Alexey
Publisher	Chemnitz Univ.-Verl.
Source Sets	OCLC
Language	English
Detected Language	English