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Electromagnetic immunity of microcontrollers failure mechanisms and modelling

Zugl.: Erlangen, Nürnberg, Univ., Diss., 2009

  1. http://d-nb.info/995862699/04
Identiferoai:union.ndltd.org:OCLC/oai:xtcat.oclc.org:OCLCNo/643549954
Date January 2009
CreatorsSu, Tao
PublisherTönning Lübeck Marburg Der Andere Verl.
Source SetsOCLC
LanguageEnglish
Detected LanguageEnglish

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