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Low voltage hot carrier issues in deep sub-micron metal oxide semiconductor field effect transistors

Mùˆnchen, University der Bundeswehr, Diss., 2001.

Identiferoai:union.ndltd.org:OCLC/oai:xtcat.oclc.org:OCLCNo/76381558
Date January 2002
CreatorsKottantharayil, Anil.
Publisher[S.l. : s.n.],
Source SetsOCLC
LanguageEnglish
Detected LanguageEnglish

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