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Using the optical microscopy imaging method for studying electromigration /

Thesis (Ph. D.)--University of Rhode Island, 2005. / Typescript. Includes bibliographical references (leaves 58-60).

Identiferoai:union.ndltd.org:OCLC/oai:xtcat.oclc.org:OCLCNo/84543586
Date January 2005
CreatorsLi, Linghong.
Source SetsOCLC
LanguageEnglish
Detected LanguageEnglish
SourceView online ; access limited to URI

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