Applications of time-of-flight secondary ion mass spectrometry (TOF-SIMS) and x-ray photoelectron spectroscopy (XPS) to study interactions of genetically engineered proteins with noble metal films /

Description

Thesis (Ph. D.)--University of Washington, 2006. / Vita. Includes bibliographical references (leaves 132-140).

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1. http://hdl.handle.net/1773/10618

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Identifer	oai:union.ndltd.org:OCLC/oai:xtcat.oclc.org:OCLCNo/85811202
Date	January 2006
Creators	Suzuki, Noriaki,
Source Sets	OCLC
Language	English
Detected Language	English
Type	Theses
Source	Connect to this title online; UW restricted