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On-Wafer Characterization of Electromagnetic Properties of Thin-Film RF Materials

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Identiferoai:union.ndltd.org:OhioLink/oai:etd.ohiolink.edu:osu1308311479
Date08 September 2011
CreatorsLee, Jun Seok
PublisherThe Ohio State University / OhioLINK
Source SetsOhiolink ETDs
LanguageEnglish
Detected LanguageEnglish
Typetext
Sourcehttp://rave.ohiolink.edu/etdc/view?acc_num=osu1308311479
Rightsunrestricted, This thesis or dissertation is protected by copyright: all rights reserved. It may not be copied or redistributed beyond the terms of applicable copyright laws.

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