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Approaches to test set generation using binary decision diagrams

This research pursues the use of powerful BDD-based functional circuit analysis to evaluate some approaches to test set generation. Functional representations of the circuit allow the measurement of information about faults that is not directly available through circuit simulation methods, such as probability of random detection and test-space overlap between faults. I have created a software tool that performs experiments to make such measurements and augments existing test generation strategies with this new information. Using this tool, I explored the relationship of fault model difficulty to test set length through fortuitous detection, and I experimented with the application of function-based methods to help reconcile the traditionally opposed goals of making test sets that are both smaller and more effective.

Identiferoai:union.ndltd.org:TEXASAandM/oai:repository.tamu.edu:1969.1/20
Date30 September 2004
CreatorsWingfield, James
ContributorsMercer, M. Ray, Grimaila, Michael, Reddy, A. L. Narasimha
PublisherTexas A&M University
Source SetsTexas A and M University
Languageen_US
Detected LanguageEnglish
TypeElectronic Thesis, text
Format261635 bytes, 67520 bytes, electronic, application/pdf, text/plain, born digital

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