The Investigation of Reliability for N-Channel FinFET in Positive Bias Temperature Instability and Hot-Carrier Stress / 正偏壓不穩定效應及熱載子效應對N型鰭化式場效電晶體之可靠度研究

碩士 / 國立高雄大學 / 電機工程學系碩士班 / 102 / 紙本專利開放日106.07.30

Identiferoai:union.ndltd.org:TW/102NUK05442036
Date January 2014
CreatorsJie-Chen Wong, 翁介晨
ContributorsWen-Kuan Yeh, 葉文冠
Source SetsNational Digital Library of Theses and Dissertations in Taiwan
Languagezh-TW
Detected LanguageEnglish
Type學位論文 ; thesis
Format62

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