Study on Reliability of P‐Channel FinFET Devices with Various Dimensions / 不同尺寸之P型先進鰭式場效電晶體可靠度之研究

碩士 / 國立高雄大學 / 電機工程學系碩士班 / 102 / 紙本專利開放日106.07.30

Identiferoai:union.ndltd.org:TW/102NUK05442037
Date January 2014
CreatorsJia-jian Hong, 洪嘉鍵
ContributorsWen-Kuan Yeh, 葉文冠
Source SetsNational Digital Library of Theses and Dissertations in Taiwan
Languagezh-TW
Detected LanguageEnglish
Type學位論文 ; thesis
Format88

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