The Investigation of Defect Distribution of NFinFET by Random Telegraph Noise / 以隨機電報雜訊對N型鰭式場效電晶體之缺陷特性研究

碩士 / 國立高雄大學 / 電機工程學系碩博士班 / 106

Identiferoai:union.ndltd.org:TW/105NUK00442042
Date January 2018
CreatorsCHEN,YU-LIN, 陳右霖
ContributorsYeh, Wen-Kuan, 葉文冠
Source SetsNational Digital Library of Theses and Dissertations in Taiwan
Languagezh-TW
Detected LanguageEnglish
Type學位論文 ; thesis
Format106

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