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Ellipsometric studies of electro-optic and ionic conductivity effects in thin oxide films

An automated ellipsometer was used to study three topics associated with the anodic oxide films of tantalum and niobium. The electro-optic effect was measured on tantalum and niobium oxides and was found to be quadratic. The change in refractive index upon application of a field occurred in two phases: an instantaneous change followed by a slower change. The effects on Nb₂O₅ were greater than on Ta₂O₅.
The effect of ultra violet light on the two oxides was found to cause a change in the refractive index before appreciable photo-induced growth occurred. The results indicated that it was unlikely that the u.v.-induced change in refractive index occurred uniformly throughout the film.
The effects of annealing and temperature are discussed in relation to the constant field current transient. The change in the refractive index during the transient was monitored with the ellipsometer. / Applied Science, Faculty of / Electrical and Computer Engineering, Department of / Graduate
Date January 1972
CreatorsCornish, William Duncan
PublisherUniversity of British Columbia
Source SetsUniversity of British Columbia
Detected LanguageEnglish
TypeText, Thesis/Dissertation
RightsFor non-commercial purposes only, such as research, private study and education. Additional conditions apply, see Terms of Use

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