In order to measure the thickness of a protein layer on a structured surface of silicon rubber, we have used ellipsometry and Fourier transform infrared (FTIR)-spectroscopy. The aim was to determine whether this type of measurement method can be used on protein layers or not. By hot-embossing a specific pattern of micrometre-sized pillars was created on the surface of the silicon rubber, which then was exposed to a phosphate buffer solution (PBS) containing human serum albumin (HSA) protein. FTIR measurements confirmed that proteins had attached to the surface. Ellipsometric studies were made and even though the protein layer was too thin to be measured, a simulation was made that revealed that a protein layer needs to be at least 1,5 nm to be measured properly with this method. We can also see that the protein molecules can get out of the solution, to find their way into the small pits of the samples.
| Identifer | oai:union.ndltd.org:UPSALLA1/oai:DiVA.org:liu-72165 |
| Date | January 2011 |
| Creators | Ekeroth, Sebastian |
| Publisher | Linköpings universitet, Institutionen för fysik, kemi och biologi |
| Source Sets | DiVA Archive at Upsalla University |
| Language | English |
| Detected Language | English |
| Type | Student thesis, info:eu-repo/semantics/bachelorThesis, text |
| Format | application/pdf |
| Rights | info:eu-repo/semantics/openAccess |
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