Return to search

Transverse microcracking in Celion 6000 graphite/PMR-15 polymide composite

The effects of room temperature tensile loading and five thermal loadings upon the development of transverse microcracks (TVM) in Celion 6000/PMR-15 graphite-epoxy laminates were investigated. Microcracks were observed using a replicating technique, microscopy and x-ray. The mechanical or thermal load at which microcracking initiates and the ply residual stresses were predicted using laminate analysis with stress and temperature-dependent materials. The TVM density as a function of tensile load was predicted using the multiple cracking theory proposed by Garrett, Parvizi and Bailey. Reasonably good correlation between theory and experiment was obtained for both the load at initial failure and the TVM density as a function of tensile load.


It has been shown that TVM density and the load to initiate microcracking are functions of the type of loading and the laminate configuration. Generally, cross-ply laminates exhibit higher TVM density after thermal loading than do quasi-isotropic laminates, but the converse is true for tensile loading. Cross-ply laminates attain saturation TVM density prior to failure, but the TVM density of quasi-isotropic laminates continues to increase until failure. Edge effects have a significant influence on the development of TVM, and TVM present at the free edge of a laminate extend throughout the entire width of the laminate.

<i>[Vita removed Feb. 15, 2011. GMc]</i> / Master of Science

Identiferoai:union.ndltd.org:VTETD/oai:vtechworks.lib.vt.edu:10919/35546
Date30 October 2008
CreatorsMills, John Steven
ContributorsEngineering Mechanics, Herakovich, Carl T., Henneke, Edmund G. II, McNitt, R. P., Davis, J. G. Jr.
PublisherVirginia Tech
Source SetsVirginia Tech Theses and Dissertation
Detected LanguageEnglish
TypeThesis, Text
Formatix, 120 pages, 1 unnumbered leaves, BTD, application/pdf, application/pdf
RightsIn Copyright, http://rightsstatements.org/vocab/InC/1.0/
RelationOCLC# 05928634, LD5655.V855_1979.M555.pdf

Page generated in 0.0063 seconds