abstract: Negative bias temperature instability (NBTI) and channel hot carrier (CHC) are important reliability issues impacting analog circuit performance and lifetime. Compact reliability models and efficient simulation methods are essential for circuit level reliability prediction. This work proposes a set of compact models of NBTI and CHC effects for analog and mixed-signal circuit, and a direct prediction method which is different from conventional simulation methods. This method is applied in circuit benchmarks and evaluated. This work helps with improving efficiency and accuracy of circuit aging prediction. / Dissertation/Thesis / M.S. Electrical Engineering 2011
| Identifer | oai:union.ndltd.org:asu.edu/item:9148 |
| Date | January 2011 |
| Contributors | Zheng, Rui (Author), Cao, Yu (Advisor), Yu, Hongyu (Committee member), Bakkaloglu, Bertan (Committee member), Arizona State University (Publisher) |
| Source Sets | Arizona State University |
| Language | English |
| Detected Language | English |
| Type | Masters Thesis |
| Format | 78 pages |
| Rights | http://rightsstatements.org/vocab/InC/1.0/, All Rights Reserved |
Page generated in 0.0019 seconds