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A TEM study of strained SiGe/Si and related heteroepitaxial structures

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1. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.251349

Identifer	oai:union.ndltd.org:bl.uk/oai:ethos.bl.uk:251349
Date	January 2002
Creators	Benedetti, Alessandro
Publisher	University of Sheffield
Source Sets	Ethos UK
Detected Language	English
Type	Electronic Thesis or Dissertation