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A structural study of the Si(001) using high resolution helium atom diffraction

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Identiferoai:union.ndltd.org:bl.uk/oai:ethos.bl.uk:254219
Date January 1987
CreatorsRohlfing, David Michael
PublisherUniversity of Cambridge
Source SetsEthos UK
Detected LanguageEnglish
TypeElectronic Thesis or Dissertation

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