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Ion bombardment induced compositional changes in compound semiconductor surfaces by XPS combined with LEISS

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1. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.282997

Identifer	oai:union.ndltd.org:bl.uk/oai:ethos.bl.uk:282997
Date	January 1995
Creators	Wei, Yu
Publisher	Aston University
Source Sets	Ethos UK
Detected Language	English
Type	Electronic Thesis or Dissertation