Return to search

The acquisition, analysis and correlation of low energy electron diffraction and scanning tunnelling microscopy data from silicon surfaces

No description available.

1. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.283430

Identifer	oai:union.ndltd.org:bl.uk/oai:ethos.bl.uk:283430
Date	January 1994
Creators	Jones, Adrian Howard
Publisher	University of York
Source Sets	Ethos UK
Detected Language	English
Type	Electronic Thesis or Dissertation